MH

Masanobu Higashide

NE Nec Electronics: 2 patents #384 of 1,789Top 25%
NE Nec: 1 patents #7,889 of 14,502Top 55%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #1,554,229 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8229584 Abnormality detection system and method of detecting abnormality Gouki Sadakuni 2012-07-24
7636609 Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values 2009-12-22
7590465 Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values 2009-09-15