MN

Masahiko Nagao

NE Nec Electronics: 5 patents #112 of 1,789Top 7%
NE Nec: 2 patents #5,510 of 14,502Top 40%
Overall (All Time): #749,454 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
7664306 Visual inspection method and visual inspection apparatus Yoshihiro Sasaki 2010-02-16
7545970 Visual inspection method and visual inspection apparatus Yoshihiro Sasaki 2009-06-09
6987894 Appearance inspection apparatus and method in which plural threads are processed in parallel Yoshihiro Sasaki 2006-01-17
6954274 Method of inspecting semiconductor integrated circuit which can quickly measure a cubic body Yoshihiro Sasaki 2005-10-11
6950549 Visual inspection method and visual inspection apparatus Yoshihiro Sasaki 2005-09-27
6741734 Appearance inspection method and appearance inspection apparatus having high inspection processing speed Yoshihiro Sasaki 2004-05-25
6597805 VISUAL INSPECTION METHOD FOR ELECTRONIC DEVICE, VISUAL INSPECTING APPARATUS FOR ELECTRONIC DEVICE, AND RECORD MEDIUM FOR RECORDING PROGRAM WHICH CAUSES COMPUTER TO PERFORM VISUAL INSPECTING METHOD FOR ELECTRONIC DEVICE 2003-07-22