Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12189285 | Droplet recipe creation method, pattern formation method, and manufacturing method of semiconductor device | Ryo Kobayashi | 2025-01-07 |
| 7640530 | Method for inspecting mask | — | 2009-12-29 |
| 6842245 | Pattern test device | — | 2005-01-11 |
| 6522122 | Jitter measuring device and method | Toshifumi Watanabe, Yuichi Miyaji | 2003-02-18 |