Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12019025 | Apparatus and method for preparing glow discharge sputtering samples for material microscopic characterization | Xing Yu, Haizhou Wang, Xuejing Shen, Xiaojia Li, Yifei Zhu +5 more | 2024-06-25 |
| 11927511 | Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy | Dongling Li, Lei Zhao, Haizhou Wang, Xuejing Shen, Qingqing Zhou +1 more | 2024-03-12 |
| 11506650 | Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials | Dongling Li, Jie Li, Haizhou Wang, Lei Zhao, Xuejing Shen +1 more | 2022-11-22 |
| 10895521 | Full-view-field quantitative statistical distribution characterization method of precipitate particles in metal material | Dongling Li, Xuejing Shen, Lei Zhao, Haizhou Wang, Bing Han +3 more | 2021-01-19 |
| 10804073 | Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structure | Haizhou Wang, Xing Yu, Xuejing Shen, Yunhai Jia, Xiaojia Li +4 more | 2020-10-13 |