Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10067012 | Stress measurement method and system for optical materials | Wei-Chung Wang, Zheng Lu, Yu-Liang YEH, Po-Yu Chen | 2018-09-04 |
| 10036677 | Method for analyzing stress in an object | Wei-Chung Wang, Yu-An Chiang, Te Heng Hung | 2018-07-31 |
| 9952034 | Optical interferometric system for measurement of a full-field thickness of a plate-like object in real time | Wei-Chung Wang | 2018-04-24 |
| 9644947 | Optical interferometric apparatus for real-time full-field thickness inspection and method thereof | Wei-Chung Wang, Chi-Hung Huang, Meng-Hsiu Li | 2017-05-09 |
| 8780348 | Apparatus for quantifying unknown stress and residual stress of a material and method thereof | Wei-Chung Wang, Chi-Hung Huang, Wei-Ren Chen, Guan-Ting Lai | 2014-07-15 |
| 8605264 | Apparatus and method for quantifying residual stress of a birefringent material | Wei-Chung Wang, Chi-Hung Huang, Yu-Cheng Tseng | 2013-12-10 |