Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9442132 | Atomic force microscope drying system and atomic force microscope | Fan-Gang Tseng | 2016-09-13 |
| 8726411 | Charged probe and electric fields measurement method thereof | Fan-Gang Tseng | 2014-05-13 |