Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196645 | Systems and methods for measuring material degradation | Stephen J. Bauer | 2025-01-14 |
| 9719908 | Electrofracturing test system and method of determining material characteristics of electrofractured material samples | Stephen J. Bauer, Steven F. Glover, Tom Pfeifle, Jiann-Cherng Su, Kenneth M. Williamson +2 more | 2017-08-01 |