Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5138619 | Built-in self test for integrated circuit memory | Walter F. Bridgewater | 1992-08-11 |
| 4922492 | Architecture and device for testable mixed analog and digital VLSI circuits | Daryl E. Mullins | 1990-05-01 |
| 4602210 | Multiplexed-access scan testable integrated circuit | John Shen | 1986-07-22 |
| 4433413 | Built-in apparatus and method for testing a microprocessor system | — | 1984-02-21 |
| 4340857 | Device for testing digital circuits using built-in logic block observers (BILBO's) | — | 1982-07-20 |