Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5528157 | Integrated circuit package for burn-in and testing of an integrated circuit die | William Robert Newberry, Eric Falconer, William B. Aronson, Mark Lippold, David W. Joy | 1996-06-18 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5528157 | Integrated circuit package for burn-in and testing of an integrated circuit die | William Robert Newberry, Eric Falconer, William B. Aronson, Mark Lippold, David W. Joy | 1996-06-18 |