Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6556876 | Hybrid fuzzy closed-loop sub-micron critical dimension control in wafer manufacturing | Patrick Ferland, Kenneth Swan | 2003-04-29 |
| 5963881 | Method and system for enhancing the identification of causes of variations in the performance of manufactured articles | Randolph W. Kahn, Kenneth G. Vickers | 1999-10-05 |