Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6289480 | Circuitry for handling high impedance busses in a scan implementation | — | 2001-09-11 |
| 6182256 | Scan flip-flop that simultaneously holds logic values from a serial load and a subsequent parallel load | — | 2001-01-30 |
| 6041426 | Built in self test BIST for RAMS using a Johnson counter as a source of data | — | 2000-03-21 |
| 5793778 | Method and apparatus for testing analog and digital circuitry within a larger circuit | — | 1998-08-11 |
| 5774475 | Testing scheme that re-uses original stimulus for testing circuitry embedded within a larger circuit | — | 1998-06-30 |
| 5774003 | Flip-flop cell having clock skew protection | Martin Person | 1998-06-30 |
| 5689466 | Built in self test (BIST) for multiple RAMs | — | 1997-11-18 |
| 5600658 | Built-in self tests for large multiplier, adder, or subtractor | — | 1997-02-04 |
| 5574731 | Set/reset scan flip-flops | — | 1996-11-12 |