Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6941013 | Method of image binarization using histogram modeling | — | 2005-09-06 |
| 5960104 | Defect detection system for lumber | Richard W. Conners, David E. Kline, Phillip A. Araman, Xiangyu Xiao | 1999-09-28 |