Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5570375 | IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing | Fang Guo, Jin-Hua Hong, Cheng-Wen Wu | 1996-10-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5570375 | IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing | Fang Guo, Jin-Hua Hong, Cheng-Wen Wu | 1996-10-29 |