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Xianlin Pan

NC National Institute Of Metrology, China: 1 patents #31 of 98Top 35%
Overall (All Time): #2,541,806 of 4,157,543Top 65%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12130313 System and method for verifying alternating current (AC)/direct current (DC) conversion of ultralow-frequency voltage based on quantum technology Qing Xu, Zhaomin Shi, Ying Song, Tiandi Zhou, Meimei Duan +2 more 2024-10-29