Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11674793 | Residual thermal strain measurement method, residual thermal strain measurement device, and program therefor | Qinghua Wang, Toshiaki Enomoto | 2023-06-13 |
| 10655954 | Three-dimensional shape, displacement, and strain measurement device and method using periodic pattern, and program therefor | Qinghua Wang, Hiroshi Tsuda | 2020-05-19 |
| 9389068 | Method and device for analysing phase distribution of fringe image using high-dimensional intensity information, and program for the same | — | 2016-07-12 |