Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10935962 | System and method for identifying root causes of yield loss | Fan-Tien Cheng, Jing Zheng | 2021-03-02 |
| 10269660 | Metrology sampling method with sampling rate decision scheme and computer program product thereof | Fan-Tien Cheng, Chun-Fang Chen, Jhao-Rong Lyu | 2019-04-23 |
| 10242319 | Baseline predictive maintenance method for target device and computer program product thereof | Fan-Tien Cheng, Chung-Ren Wang, Saint-Chi Wang | 2019-03-26 |