Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416856 | Method of manufacturing semiconductor device structure | YUNG-CHUAN YEH | 2025-09-16 |
| 12242202 | Method for overlay error correction | — | 2025-03-04 |
| 12002765 | Marks for overlay measurement and overlay error correction | — | 2024-06-04 |
| 11796924 | Method for overlay error correction and method for manufacturing a semiconductor device structure with overlay marks | — | 2023-10-24 |