Issued Patents All Time
Showing 1–25 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12396162 | Semiconductor device with programable feature | Yin Chen | 2025-08-19 |
| 12308315 | Fuse component and semiconductor device | KAI-PO SHANG | 2025-05-20 |
| 12272642 | Benchmark device on a semiconductor wafer with fuse element | Yi-Ju Chen | 2025-04-08 |
| 12181517 | Method for detecting memory chip | Yan-De Lin | 2024-12-31 |
| 12057393 | Semiconductor device with fuse component | KAI-PO SHANG | 2024-08-06 |
| 12002752 | Method for manufacturing a fuse component | KAI-PO SHANG | 2024-06-04 |
| 11916015 | Fuse component, semiconductor device, and method for manufacturing a fuse component | KAI-PO SHANG | 2024-02-27 |
| 11876044 | Method for activating backup unit through fuse element | Yi-Ju Chen | 2024-01-16 |
| 11876024 | Method for operating a benchmark device on a semiconductor wafer with fuse element | Yi-Ju Chen | 2024-01-16 |
| 11843030 | Fuse elements and semiconductor devices | Yi-Ju Chen | 2023-12-12 |
| 11747394 | Probe apparatus with a track | Yi-Ju Chen | 2023-09-05 |
| 11699624 | Semiconductor structure with test structure | Tsang-Po Yang | 2023-07-11 |
| 11668745 | Probe apparatus having a track and wafer inspection method using the same | Yi-Ju Chen | 2023-06-06 |
| 11557360 | Memory test circuit and device wafer | Yan-De Lin | 2023-01-17 |
| 11521901 | Method for preparing semiconductor device | Chun-Shun Huang, Wei-Li Lai | 2022-12-06 |
| 11521976 | Semiconductor device with bit line contact and method for fabricating the same | Yi-Ting Tsai | 2022-12-06 |
| 11456224 | Semiconductor structure with test structure | Tsang-Po Yang | 2022-09-27 |
| 11417574 | Semiconductor device with testing structure and method for fabricating the same | Tsang-Po Yang | 2022-08-16 |
| 11262398 | Testing fixture and testing assembly | Ching-Chung Wang | 2022-03-01 |
| 11237205 | Test array structure, wafer structure and wafer testing method | Tsang-Po Yang | 2022-02-01 |
| 11209477 | Testing fixture and testing assembly | Ching-Chung Wang | 2021-12-28 |
| 11143690 | Testing structure and testing method | Hsueh-Han Lu | 2021-10-12 |
| 11024553 | Semiconductor structure and manufacturing method thereof | Tsang-Po Yang, Chun-Shun Huang | 2021-06-01 |
| 10985077 | Semiconductor device and method for preparing the same | Chun-Shun Huang, Wei-Li Lai | 2021-04-20 |
| 10877086 | Holder | Ching-Chung Wang | 2020-12-29 |