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Anuj Doshi

NI Nanotronics Imaging: 3 patents #23 of 43Top 55%
📍 Manhattan, NY: #61 of 142 inventorsTop 45%
🗺 New York: #38,318 of 115,490 inventorsTop 35%
Overall (All Time): #1,320,736 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
12387317 Artificial intelligence process control for assembly processes Jonathan Lee 2025-08-12
12243293 System and method for generating training data sets for specimen defect detection Jonathan Lee, John B. Putman 2025-03-04
11727672 System and method for generating training data sets for specimen defect detection Jonathan Lee, John B. Putman 2023-08-15