Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387317 | Artificial intelligence process control for assembly processes | Jonathan Lee | 2025-08-12 |
| 12243293 | System and method for generating training data sets for specimen defect detection | Jonathan Lee, John B. Putman | 2025-03-04 |
| 11727672 | System and method for generating training data sets for specimen defect detection | Jonathan Lee, John B. Putman | 2023-08-15 |