CR

Chris Raymond

NI Nanometrics Incorporated: 5 patents #17 of 127Top 15%
📍 Las Vegas, NV: #552 of 3,439 inventorsTop 20%
🗺 Nevada: #1,427 of 8,397 inventorsTop 20%
Overall (All Time): #866,673 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
8027037 Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpiece Mike Littau, Darren Forman, Steven G. Hummel 2011-09-27
7656542 Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpiece Mike Littau, Darren Forman, Steven G. Hummel 2010-02-02
7615752 Apparatus and method for enhanced critical dimension scatterometry Steve Hummel 2009-11-10
7511293 Scatterometer having a computer system that reads data from selected pixels of the sensor array Steve Hummel 2009-03-31
7502101 Apparatus and method for enhanced critical dimension scatterometry Steve Hummel, Sean Liu 2009-03-10
6099299 Support attachment and cigarette lighter safety device Lynn Raymond, LaRue Birmingham 2000-08-08