Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12190495 | Microscopic non-destructive measurement method of microstructure linewidth based on translation difference | Zhishan Gao, Jianqiu Ma, Yifeng Sun, Xiao Huo, Shumin Wang +2 more | 2025-01-07 |