Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12144096 | Method for measuring electron nonextensive parameter of plasma using nonextensive statistical mechanics | Huibin Qiu, Donghua Xiao, Xingkun Peng, Yuqing Zhu, Xianyang Zhang +7 more | 2024-11-12 |
| 11856682 | Method for measuring plasma ion nonextensive parameter | Huibin Qiu, Zuozhi Hu, Donghua Xiao, Shengfa Wu, Chengjie Zhong +16 more | 2023-12-26 |