Issued Patents All Time
Showing 26–45 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7592818 | Method and apparatus for measuring scattering coefficient of device under test | Taishi Mori | 2009-09-22 |
| 7540885 | Method of processing a ceramic capacitor | — | 2009-06-02 |
| 7466283 | Coil antenna structure and portable electronic apparatus | Hiroshi Marusawa, Takehiro Konoike, Kazunari Kawahata | 2008-12-16 |
| 7439748 | Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics | — | 2008-10-21 |
| 7405576 | Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics | — | 2008-07-29 |
| 7375534 | Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics | — | 2008-05-20 |
| 6960920 | Method for correcting measurement error and electronic component characteristic measurement apparatus | — | 2005-11-01 |
| 6956391 | Testing method for electronic component and testing device | — | 2005-10-18 |
| 6919733 | Electronic component production method and burn-in apparatus | — | 2005-07-19 |
| 6876935 | Method for correcting measurement error, method of determining quality of electronic component, and device for measuring characteristic of electronic component | — | 2005-04-05 |
| 6838885 | Method of correcting measurement error and electronic component characteristic measurement apparatus | — | 2005-01-04 |
| 6697749 | Correction method of measurement errors, quality checking method for electronic components, and characteristic measuring system of electronic components | — | 2004-02-24 |
| 6674295 | Impedance measuring apparatus for electronic component | — | 2004-01-06 |
| 6639410 | Insulation resistance measuring apparatus for capacitive electronic parts | — | 2003-10-28 |
| 6518777 | Method and apparatus for measuring insulation resistance | Akihiro Hayashi, Koichi Teramura | 2003-02-11 |
| 6456087 | Insulation resistance measuring apparatus for capacitive electronic parts | — | 2002-09-24 |
| 6384609 | Method of measuring insulation resistance of capacitors | Hiroaki Nagai | 2002-05-07 |
| 6285193 | Method of measuring insulation resistance of capacitor and apparatus for screening characteristics | — | 2001-09-04 |
| 6184688 | Method of measuring insulation resistance of capacitor and apparatus for screening characteristics | — | 2001-02-06 |
| 6127828 | Apparatus for measuring resistance of electronic component | — | 2000-10-03 |