Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8449002 | Closure mechanism for pressure test chambers for testing electronic components, in particular ICs | Andreas Nagy, Manfred Eibl, Stefan Kurz | 2013-05-28 |
| 7741861 | Test apparatus for the testing of electronic components | Manuel Petermann, Stefan Kurz, Andeas Nagy | 2010-06-22 |