Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5959462 | Test structure for enabling burn-in testing on an entire semiconductor wafer | — | 1999-09-28 |
| 5707881 | Test structure and method for performing burn-in testing of a semiconductor product wafer | — | 1998-01-13 |
| 5534784 | Method for probing a semiconductor wafer | James F. Wenzel | 1996-07-09 |
| 4580197 | Light collimizing device | — | 1986-04-01 |