Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6577148 | Apparatus, method, and wafer used for testing integrated circuits formed on a product wafer | James F. Wenzel | 2003-06-10 |
| 6411116 | Method for testing a product integrated circuit wafer using a stimulus integrated circuit wafer | James F. Wenzel | 2002-06-25 |
| 6150724 | Multi-chip semiconductor device and method for making the device by using multiple flip chip interfaces | James F. Wenzel, Bryan D. Marietta, James P. Johnston | 2000-11-21 |
| 5701666 | Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer | James F. Wenzel | 1997-12-30 |