Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5827970 | Non-destructive method of determining substrate tilt within a packaged semiconductor component | Isaac T. Poku, Yushi Matsuda | 1998-10-27 |
| 5756885 | Method for determining the cleanliness of a surface | Isaac T. Poku | 1998-05-26 |