Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5388323 | Method of forming a probe for an atomic force microscope | Theresa J. Hopson, Ronald N. Legge | 1995-02-14 |
| 5356218 | Probe for providing surface images | Theresa J. Hopson, Ronald N. Legge | 1994-10-18 |
| 5338932 | Method and apparatus for measuring the topography of a semiconductor device | N. David Theodore | 1994-08-16 |
| 5326971 | Transmission electron microscope environmental specimen holder | N. David Theodore | 1994-07-05 |
| 5214389 | Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position | Beatrice M. Cao | 1993-05-25 |