Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8253423 | Multiple line width electromigration test structure and method | Jeremy Martin | 2012-08-28 |
| 5970383 | Method of manufacturing a semiconductor device with improved control of deposition layer thickness | — | 1999-10-19 |
| 5690749 | Method for removing sub-micron particles from a semiconductor wafer surface by exposing the wafer surface to clean room adhesive tape material | — | 1997-11-25 |
| 5623166 | Al-Ni-Cr conductive layer for semiconductor devices | Johnson O. Olowolafe, Hisao Kawasaki | 1997-04-22 |
| 5593919 | Process for forming a semiconductor device including conductive members | Hisao Kawasaki | 1997-01-14 |
| 5506450 | Semiconductor device with improved electromigration resistance and method for making the same | Hisao Kawasaki | 1996-04-09 |
| 5393703 | Process for forming a conductive layer for semiconductor devices | Johnson O. Olowolafe, Hisao Kawasaki | 1995-02-28 |