Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12253718 | Mid-infrared optical fibers with enhanced OH-diffusion resistance | Martin Bernier, Réal Vallée, Souleymane Toubou Bah, Frédéric MAES, Yigit Ozan Aydin | 2025-03-18 |
| 12149107 | System and method using wireless latching relay for vehicle fleet management inventory | Martin Tessier, Mathieu Bertrand-Collin, Alexandre Roy-Langlois, Duc Minh Cong Nguyen | 2024-11-19 |
| 11846807 | Mid-infrared optical fibers with enhanced OH-diffusion resistance | Martin Bernier, Réal Vallée, Souleymane Toubou Bah, Frédéric MAES, Yigit Ozan Aydin | 2023-12-19 |
| 10084287 | Mid-infrared laser system, mid-infrared optical amplifier, and method of operating a mid-infrared laser system | Martin Bernier, Réal Vallée, Jean-Christophe Gauthier, Simon Duval | 2018-09-25 |
| 8071486 | Method for removing residues formed during the manufacture of MEMS devices | Jean-Michel Ouellet | 2011-12-06 |
| 7799376 | Method of controlling film stress in MEMS devices | Luc Ouellet | 2010-09-21 |
| 6984574 | Cobalt silicide fabrication using protective titanium | Kuei-Chang Tsai | 2006-01-10 |
| 6835646 | Forming conductive layers on insulators by physical vapor deposition | — | 2004-12-28 |
| 6816896 | Method and apparatus for detecting changes to network elements | Will C. Lauer, Lawrence A. Stabile, Richard B. Wallace | 2004-11-09 |
| 6787914 | Tungsten-based interconnect that utilizes thin titanium nitride layer | — | 2004-09-07 |
| 6780086 | Determining an endpoint in a polishing process | Kuo-Chun Wu | 2004-08-24 |
| 6670267 | Formation of tungstein-based interconnect using thin physically vapor deposited titanium nitride layer | — | 2003-12-30 |
| 6503824 | Forming conductive layers on insulators by physical vapor deposition | — | 2003-01-07 |
| 6372671 | Surface stabilization of silicon rich silica glass using increased post deposition delay | — | 2002-04-16 |