Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8471580 | Dopant profile measurement module, method and apparatus | Hassan Tanbakuchi, Roger B. Stancliff, Timothy M. Graham | 2013-06-25 |
| 6134955 | Magnetic modulation of force sensor for AC detection in an atomic force microscope | Stuart Lindsay, Tianwei Jing | 2000-10-24 |
| 5983712 | Microscope for compliance measurement | Stuart Lindsay, Tianwei Jing | 1999-11-16 |
| 5866805 | Cantilevers for a magnetically driven atomic force microscope | Stuart Lindsay, Tianwei Jing | 1999-02-02 |
| 5753814 | Magnetically-oscillated probe microscope for operation in liquids | Stuart Lindsay, Steven K. Harbaugh, Tianwei Jing | 1998-05-19 |