Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8271103 | Automated model building and model updating | Stela Diamant Lazarovich, Ron Hadar, Nouna Kettaneh, Uzi Levami, Dmitry Perlroizen | 2012-09-18 |
| 7996102 | Process control using process data and yield data | Kuo-Chin Lin, Svante Bjarne Wold | 2011-08-09 |
| 7809450 | Self-correcting multivariate analysis for use in monitoring dynamic parameters in process environments | Uzi Lev-Ami | 2010-10-05 |
| 7630786 | Manufacturing process end point detection | Matthew Richter | 2009-12-08 |
| 7622308 | Process control using process data and yield data | Kuo-Chin Lin, Svante Bjarne Wold | 2009-11-24 |
| 7313454 | Method and apparatus for classifying manufacturing outputs | Matthew Richter | 2007-12-25 |
| 5966212 | High-speed, high-resolution, large area inspection using multiple optical fourier transform cells | Michael Watts, Richard A. Portune | 1999-10-12 |
| 5656942 | Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane | Michael Watts | 1997-08-12 |
| 5506676 | Defect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform components | Michael Watts | 1996-04-09 |