| 8271103 |
Automated model building and model updating |
Stela Diamant Lazarovich, Ron Hadar, Nouna Kettaneh, Uzi Levami, Dmitry Perlroizen |
2012-09-18 |
| 7996102 |
Process control using process data and yield data |
Kuo-Chin Lin, Svante Bjarne Wold |
2011-08-09 |
| 7809450 |
Self-correcting multivariate analysis for use in monitoring dynamic parameters in process environments |
Uzi Lev-Ami |
2010-10-05 |
| 7630786 |
Manufacturing process end point detection |
Matthew Richter |
2009-12-08 |
| 7622308 |
Process control using process data and yield data |
Kuo-Chin Lin, Svante Bjarne Wold |
2009-11-24 |
| 7313454 |
Method and apparatus for classifying manufacturing outputs |
Matthew Richter |
2007-12-25 |
| 5966212 |
High-speed, high-resolution, large area inspection using multiple optical fourier transform cells |
Michael Watts, Richard A. Portune |
1999-10-12 |
| 5656942 |
Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane |
Michael Watts |
1997-08-12 |
| 5506676 |
Defect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform components |
Michael Watts |
1996-04-09 |