Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10892153 | Robust ion source | James Edward Blessing, Jonathan Leslie | 2021-01-12 |
| 10541122 | Robust ion source | James Edward Blessing, Jonathan Leslie | 2020-01-21 |
| 8796620 | Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens | Philip Shaw | 2014-08-05 |
| 8796638 | Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens | Philip Shaw | 2014-08-05 |
| 8450681 | Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets | Philip Shaw | 2013-05-28 |
| 5384461 | Process for the manufacture of a multipolar elongate-electrode lens or mass filter | Joseph P. R. Jullien, Robert Mellor | 1995-01-24 |
| 4535236 | Apparatus for and method of operating quadrupole mass spectrometers in the total pressure mode | — | 1985-08-13 |