Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11555683 | Form measuring instrument and method of detecting abnormality | Tomoyuki Miyazaki | 2023-01-17 |
| 10788312 | Coordinate measuring unit and method for recognizing measuring probe | Kazuhiko Hidaka | 2020-09-29 |