KK

Kazuhiko Kawasaki

MI Mitutoyo: 15 patents #47 of 721Top 7%
Ricoh Company: 4 patents #4,167 of 9,818Top 45%
HC Hitachi Seibu Software Co.: 1 patents #1 of 35Top 3%
GI Gs Yuasa International: 1 patents #283 of 491Top 60%
RS Ricoh Printing Systems: 1 patents #97 of 200Top 50%
JA Jasco: 1 patents #46 of 125Top 40%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
📍 Ibaraki, NJ: #2 of 6 inventorsTop 35%
Overall (All Time): #173,721 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #TitleCo-InventorsDate
10444004 Phase shift interferometer 2019-10-15
10161805 Laser frequency measurement method using optical frequency comb 2018-12-25
10088291 Instantaneous phase-shift interferometer Shinpei Matsuura 2018-10-02
9995634 Laser frequency measurement method and device using optical frequency comb 2018-06-12
8490965 Sheet-supplying device Satoshi Ueda, Shingo Takai, Tatsuo Matsuda 2013-07-23
8403319 Sheet-supplying device Satoshi Ueda, Shingo Takai, Tatsuo Matsuda 2013-03-26
8368900 Lightwave interferometric distance measuring method and apparatus using an optical comb Kaoru Miyata 2013-02-05
8314940 Probe microscope Yoshimasa Suzuki, Satoshi Koga 2012-11-20
8108942 Probe microscope Yoshimasa Suzuki, Satoshi Koga 2012-01-31
8041277 Image forming apparatus Yasushi Hashimoto, Motoji Kurobane, Masami Takeshita 2011-10-18
7907288 Shape measuring apparatus Satoshi Koga, Yoshimasa Suzuki 2011-03-15
7872420 Ceramic metal halide lamp having rated lamp wattage between 450 W and 1500W without flicker Shinji Taniguchi, Kuniaki Nakano 2011-01-18
7841591 Sheet-supplying device Satoshi Ueda, Shingo Takai, Tatsuo Matsuda 2010-11-30
7681439 Measuring apparatus Satoshi Koga, Yoshimasa Suzuki 2010-03-23
7511827 Interferometer and method of calibrating the interferometer Yoshimasa Suzuki, David William Sesko 2009-03-31
7499178 Oblique incidence interferometer Yoshimasa Suzuki, Reiya Ootao 2009-03-03
7458570 Sheet-supplying device Satoshi Ueda, Shingo Takai, Tatsuo Matsuda 2008-12-02
7397570 Interferometer and shape measuring method Yoshimasa Suzuki, David William Sesko 2008-07-08
6552807 Apparatus and method for shape measurement using interferometer Naoki Mitsutani, Hiroshi Haino 2003-04-22
6496269 Shape measuring apparatus Naoki Mitsutani, Hirohisa Handa, Hiroshi Haino 2002-12-17
6473186 Scanning wide-area surface shape analyzer Naoki Mitsutani, Hiroshi Haino 2002-10-29
6296129 Method for shrink-wrapping containers and articles obtained thereby 2001-10-02
5555439 Learning system and a learning pattern showing method for a neural network Junichi Higashino, Miyuki HARA 1996-09-10
5347364 Total reflection measuring apparatus Tadashi Miyazaki 1994-09-13