Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12322079 | Inspection device, inspection method, and recording medium for inspecting an inspection target with machine learning | Yuichi Ikeda, Kazuyuki Miyazawa, Akira Minezawa | 2025-06-03 |