Issued Patents All Time
Showing 76–100 of 111 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5805508 | Semiconductor memory device with reduced leak current | — | 1998-09-08 |
| 5801412 | Semiconductor device having a capacitance element with excellent area efficiency | — | 1998-09-01 |
| 5757225 | Voltage generation circuit that can stably generate intermediate potential independent of threshold voltage | — | 1998-05-26 |
| 5726941 | Semiconductor integrated circuit | — | 1998-03-10 |
| 5717324 | Intermediate potential generation circuit | — | 1998-02-10 |
| 5548596 | Semiconductor memory device with read out data transmission bus for simultaneously testing a plurality of memory cells and testing method thereof | — | 1996-08-20 |
| 5523977 | Testing semiconductor memory device having test circuit | Yasuji Nagayama | 1996-06-04 |
| 5418747 | Dynamic random access memory having a plurality of rated voltages as operation supply voltage and operating method thereof | — | 1995-05-23 |
| 5404335 | Dynamic type semiconductor memory device operable in a self-refreshing mode | — | 1995-04-04 |
| RE34718 | DRAM with reduced-test-time-mode | — | 1994-09-06 |
| 5315550 | Dynamic random access memory having sense amplifier activation delayed based on operation supply voltage and operating method thereof | — | 1994-05-24 |
| 5276649 | Dynamic-type semiconductor memory device having staggered activation of column groups | Tetsushi Hoshita, Kenji Tokami | 1994-01-04 |
| 5267200 | Semiconductor memory device and operating method thereof with transfer transistor used as a holding means | — | 1993-11-30 |
| 5132932 | Dynamic random access memory having a plurality of rated voltages as operation supply voltage and operating method thereof | — | 1992-07-21 |
| 5115412 | Data read circuit of semiconductor memory device and method of reading data out | — | 1992-05-19 |
| 5079744 | Test apparatus for static-type semiconductor memory devices | Yuji Kihara | 1992-01-07 |
| 5065091 | Semiconductor integrated circuit device testing | — | 1991-11-12 |
| 5023840 | Semiconductor memory device having testing function and testing method thereof | — | 1991-06-11 |
| 4989183 | Semiconductor memory device improved for externally designating operation mode | Masaki Kumanoya, Katsumi Dosaka, Yasuhiro Konishi, Takahiro Komatsu | 1991-01-29 |
| 4984210 | Semiconductor memory device improved for externally designating operation mode | Masaki Kumanoya, Katsumi Dosaka, Yasuhiro Konishi, Takahiro Komatsu | 1991-01-08 |
| 4980799 | Electrostatic capacity device in semiconductor memory device, and apparatus for and method of driving sense amplifier using electrostatic capacity device | — | 1990-12-25 |
| 4961007 | Substrate bias potential generator of a semiconductor integrated circuit device and a generating method therefor | Masaki Kumanoya, Yasuhiro Konishi, Katsumi Dosaka, Takahiro Komatsu | 1990-10-02 |
| 4951256 | Apparatus and method for driving sense amplifier in dynamic random access memory | — | 1990-08-21 |
| 4860259 | Dram with reduced-test-time mode | — | 1989-08-22 |
| 4833656 | Fast access circuit for dynamic type semiconductor memory device | — | 1989-05-23 |