Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7081908 | Apparatus and method for testing electrode structure for thin display device using FET function | Shinichi Murakawa, Takashi Doi, Shigeo Ueda | 2006-07-25 |
| 6667632 | Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection | Shinichi Murakawa, Soumyo Doi, Tadashi Rokkaku, Shigeo Ueda | 2003-12-23 |
| 5894938 | Glass cullet separation apparatus | Junichi Ichise, Tatsunori Hayashi, Yasuhiko Ikegami, Makoto Kaneuchi, Toshio Sanagawa +1 more | 1999-04-20 |