Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7225358 | Semiconductor integrated circuit device having operation test function | Kenichi Sakai, Yasumasa Morita | 2007-05-29 |
| 6163760 | Method of producing a test pattern allowing determination of acceptance and rejection of a semiconductor device without causing a timing problem | — | 2000-12-19 |
| 5594891 | Bus checking device and bus checking method | — | 1997-01-14 |