Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4991969 | Method for measuring film thickness | Makoto Tokumaru, Masayuki Ariki, Hideki Nakano | 1991-02-12 |
| 4924105 | Optical measuring device with alternately-activated detection | — | 1990-05-08 |
| 4810894 | Method and apparatus for measuring film thickness using a second sheet of known thickness | Masayuki Ariki, Yoshiaki Ida | 1989-03-07 |
| 4748331 | Film thickness measuring device with signal averaging to compensate for roller eccentricity | Masayuki Ariki, Yoshiaki Ida | 1988-05-31 |
| 4730116 | Sheet thickness measuring apparatus by optical scanning | Yoshiaki Ida | 1988-03-08 |