Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5398197 | Method of creating debug specification and test program creating specification | Yuko Sudou | 1995-03-14 |
| 5375075 | Semiconductor measuring apparatus and method of preparing debugging program | Yuko Sudou | 1994-12-20 |
| 5262721 | Electronic circuit testing apparatus and testing method using the same | — | 1993-11-16 |
| 5053981 | Method of measuring electrical characteristics of electronic circuit | Yuko Sudou | 1991-10-01 |
| 5020009 | Method and apparatus for preparing measurement specifications of electronic circuits | Yuko Sudou | 1991-05-28 |
| 5020010 | Method for preparing and evaluating measurement specificatons for an electronic circuit | Yuko Sudou | 1991-05-28 |
| 4977531 | Apparatus for automatic preparation of measurement programs | Yuko Sudou | 1990-12-11 |