Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7028123 | Microcomputer, has selection circuit to select either testing-purpose interrupt request signal or interrupt request selection signal based on delayed selection signal, where selected signals are sent to interrupt controller | — | 2006-04-11 |
| 6865703 | Scan test system for semiconductor device | Masayuki Konishi | 2005-03-08 |
| 6819580 | Semiconductor chip selectively providing a predetermined potential to a dead pin | Masayuki Konishi | 2004-11-16 |
| 6789174 | Memory access device allowing simultaneous access | Masayuki Konishi | 2004-09-07 |
| 6711708 | Boundary-scan test method and device | — | 2004-03-23 |
| 6674153 | Semiconductor device utilizing pad to pad wire interconnection for improving detection of failed region on the device | Katsuyoshi Watanabe | 2004-01-06 |
| 6150886 | Phase locked loop circuit with multiple combinations which each produce a single phase and multiphase clock signals | — | 2000-11-21 |
| 6091351 | A/D converter and level shifter | — | 2000-07-18 |
| 5956270 | Flash memory and microcomputer | Nobusuke Abe | 1999-09-21 |
| 5898396 | Analog-to-digital converter for both m-bit and n-bit analog conversion | Nobusuke Abe | 1999-04-27 |
| 5737381 | Counting device | Nobusuke Abe, Yoshikazu Satoh | 1998-04-07 |
| 5590035 | Output control circuit | Takashi Miyake | 1996-12-31 |
| 4668569 | Matte film | Kojiro Ito, Kunio Murakami, Minoru Kishida | 1987-05-26 |