Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5107205 | Semiconductor device tester with a test waveform monitoring circuit | — | 1992-04-21 |
| 5021733 | Burn-in apparatus | Yasuhiko Fukushima | 1991-06-04 |
SE
Sachiko Ebihara
Overall (All Time): #2,308,760 of 4,157,543Top 60%
2
Patents All Time