Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6737870 | Capacitance measurement method | Takeshi Okagaki, Tatsuya Kunikiyo | 2004-05-18 |
| 5508632 | Method of simulating hot carrier deterioration of an MOS transistor | Satoshi Shimizu | 1996-04-16 |