Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12339160 | Laser light profile measuring device and laser light profile measuring method | Ryuichi Narita, Toshiya Watanabe, Takeshi Kaneko, Takayuki Numata | 2025-06-24 |
| 12140564 | Defect detection method, defect detection device, and additive manufacturing device | Nobuhiro Higuchi, Natsuse Morimoto | 2024-11-12 |
| 11073378 | Clearance measurement device, clearance measurement sensor, and clearance measurement method | Akio Kondou, Tomoyuki Onishi, Takahiro Miyamoto | 2021-07-27 |
| 10816324 | Clearance measurement device and clearance control system | Akio Kondo, Tomoyuki Onishi, Takahiro Miyamoto | 2020-10-27 |