Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5600171 | Mask ROM device | Hiroyasu Makihara, Akira Okugaki, Masahide Kaneko | 1997-02-04 |
| 5467457 | Read only type semiconductor memory device including address coincidence detecting circuits assigned to specific address regions and method of operating the same | Yasuhiro Kouro | 1995-11-14 |
| 5450424 | Semiconductor memory device with error checking and correcting function | Akira Okugaki, Hiroyasu Makihara | 1995-09-12 |
| 5383205 | Semiconductor memory device having an error correction circuit and an error correction method of data in a semiconductor memory device | Hiroyasu Makihara | 1995-01-17 |
| 5243573 | Sense amplifier for nonvolatile semiconductor storage devices | Hiroyasu Makihara | 1993-09-07 |
| 5182725 | Nonvolatile semiconductor memory device with reduced variation in source potential of floating gate type memory transistor and operating method therefor | Nobuaki Andoh, Tsuyoshi Toyama, Kenji Noguchi, Shinichi Kobayashi | 1993-01-26 |
| 5107313 | Floating gate type semiconductor memory device | Tsuyoshi Toyama, Nobuaki Andoh, Kenji Noguchi, Shinichi Kobayashi | 1992-04-21 |
| 5105386 | Nonvolatile semiconductor memory device with reduced variation in source potential of floating gate type memory transistors and operating method therefor | Nobuaki Andoh, Tsuyoshi Toyama, Kenji Noguchi, Shinichi Kobayashi | 1992-04-14 |
| 5097152 | Buffer circuit used in a semiconductor device operating by different supply potentials and method of operating the same | Tsuyoshi Toyama, Yasuhiro Kouro, Hiroyasu Makihara | 1992-03-17 |
| 5058071 | Semiconductor memory device having means for repairing the memory device with respect to possible defective memory portions | Yasuhiro Kouro, Hiroyasu Makihara, Tsuyoshi Toyama | 1991-10-15 |
| 5021999 | Non-volatile semiconductor memory device with facility of storing tri-level data | Tsuyoshi Toyama, Nobuaki Ando, Kenji Noguchi, Shinichi Kobayashi | 1991-06-04 |
| 5003205 | Buffer circuit used in a semiconductor device operating by different supply potentials and method of operating the same | Tsuyoshi Toyama, Yasuhiro Kouro, Hiroyasu Makihara | 1991-03-26 |
| 4958352 | Semiconductor memory device with error check and correcting function | Kenji Noguchi, Tsuyoshi Toyama, Shinichi Kobayashi, Nobuaki Andoh | 1990-09-18 |
| 4949305 | Erasable read-only semiconductor memory device | Tsuyoshi Toyama, Nobuaki Andoh, Kenji Noguchi, Shinichi Kobayashi | 1990-08-14 |
| 4827452 | Semiconductor memory including a selectively disabled redunancy circuit | Tsuyoshi Toyama, Toshihiro Koyama | 1989-05-02 |
| 4779272 | Testable variable-threshold non-volatile semiconductor memory | Tsuyoshi Toyama, Nobuaki Ando | 1988-10-18 |