Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6314099 | Address match determining device, communication control system, and address match determining method | Yukio Fujisawa, Christoph Gottschalk, Hans-Michael Loch | 2001-11-06 |
| 5493236 | Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis | Tatsuya Ishii | 1996-02-20 |