Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6339229 | Test structure for insulation-film evaluation | Naofumi Murata | 2002-01-15 |
| 6127837 | Method of testing semiconductor devices | Shigehisa Yamamoto | 2000-10-03 |
| 6037794 | Semiconductor device testing apparatus and testing method thereof | Shigehisa Yamamoto | 2000-03-14 |