Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215639 | Probe card, semiconductor measuring device, and semiconductor measuring system | Takayuki Matsumoto, Tomoaki Nakamura | 2022-01-04 |
| 5905384 | Method for testing semiconductor element | Akira Inoue, Yasuharu Nakajima, Yukio Ohta | 1999-05-18 |
| 5801528 | Semiconductor element evaluating apparatus | Takayuki Katoh | 1998-09-01 |
| 5786627 | Integrated circuit device and fabricating thereof | Akira Inoue, Kei Goto, Yoshihiro Notani, Yasuharu Nakajima, Yukio Ohta | 1998-07-28 |
| 5675184 | Integrated circuit device | Kei Goto, Yoshihiro Notani, Yukio Ohta, Akira Inoue, Yasuharu Nakajima | 1997-10-07 |
| 5426399 | Film carrier signal transmission line having separating grooves | Yasuharu Nakajima, Yoshihiro Notani | 1995-06-20 |
| 5412235 | Monolithic integrated circuit including gate bias transistor controlling the gate bias applied to an amplifying transistor | Yasuharu Nakajima | 1995-05-02 |