Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6589063 | Electric contact device for establishing an improved contact with contactors of other device | Yoshitaka Kamo, Tatsushi Higashi | 2003-07-08 |
| 6151695 | Test method of chips in a semiconductor wafer employing a test algorithm | Yoshitaka Kamo, Tatsushi Higashi, Akihiro Kuroda | 2000-11-21 |
| 5932891 | Semiconductor device with test terminal and IC socket | Tatsushi Higashi, Akihiro Kuroda | 1999-08-03 |